1、使用smartclt命令查看硬盘的smart信息，如以下范例：
smartctl -a /dev/sdb| smartctl 6.5 2016-05-07 r4318 [x86_64-linux-4.14.0-49.15.x86_64] (local build) Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model: SAMSUNG MZ7LH480HAHQ-00005 Serial Number: S45PNA0M540908 LU WWN Device Id: 5 002538 e001d842c Firmware Version: HXT7404Q User Capacity: 480,103,981,056 bytes [480 GB] Sector Sizes: 512 bytes logical, 4096 bytes physical Rotation Rate: Solid State Device Form Factor: 2.5 inches Device is: Not in smartctl database [for details use: -P showall] ATA Version is: Unknown(0x0ffc), ACS-4 T13/BSR INCITS 529 revision 5 SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Tue Oct 19 16:03:51 2021 CST SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART Status not supported: ATA return descriptor not supported by controller firmware SMART overall-health self-assessment test result: PASSED Warning: This result is based on an Attribute check. General SMART Values: Offline data collection status: (0x00)Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0)The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x53) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003)Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01)Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 35) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported.
SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. |
smartctl -a /dev/sdc| smartctl 6.5 2016-05-07 r4318 [x86_64-linux-4.14.0-49.15.x86_64] (local build) Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model: SAMSUNG MZ7LH480HAHQ-00005 Serial Number: S45PNA2MC20956 LU WWN Device Id: 5 002538 e19c1c198 Firmware Version: HXT7404Q User Capacity: 480,103,981,056 bytes [480 GB] Sector Sizes: 512 bytes logical, 4096 bytes physical Rotation Rate: Solid State Device Form Factor: 2.5 inches Device is: Not in smartctl database [for details use: -P showall] ATA Version is: Unknown(0x0ffc), ACS-4 T13/BSR INCITS 529 revision 5 SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Tue Oct 19 16:03:51 2021 CST SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART Status not supported: ATA return descriptor not supported by controller firmware SMART overall-health self-assessment test result: PASSED Warning: This result is based on an Attribute check. General SMART Values: Offline data collection status: (0x00)Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0)The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x53) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003)Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01)Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 35) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported.
SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. |
2、三星的硬盘根据smart信息中的177项判断硬盘的剩余寿命，如以下信息：
（1）序列号为：S45PNA0M540908的sdb硬盘，177项的VALUE和WORST都是86，说明硬盘的寿命剩余86％。
| Vendor Specific SMART Attributes with Thresholds:
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（2）序列号为：S45PNA2MC20956的sdc硬盘，177项的VALUE和WORST都是92，说明硬盘的寿命剩余92％。
| Vendor Specific SMART Attributes with Thresholds:
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