M5513
DDR5 MR-DIMM Module Test System
Complete Chaaracterization and Funcational Testing of MR-DIMM Modules
TheM5513is an all-inclusivememory test system for next-generation DDR5 multiplexed-rank dual inline memory modules (MR-DIMM). Operating at blisteringly fast speeds,
this test system is an ideal solution for long-term DIMM development and test. It contains a complete side-band bus controller and provides full access to all command, address,
and data pins on a standard288-pinDIMMunder test.TheM5513cancharacterizethe DDR interface at its maximum speed, and it can also perform exhaustivememory read-write
testingandfunctional stress testing. A true ATE-on-Bench, the M5513 reduces cost and enhances interoperability of DDR5 systems.
KEY FEATURES KEY BENEFITS
• User configurable training: full suite of DDR5 • Fastest time to market: use a single investment in
training and equalization algorithms hardware to evolve DIMM testing over multiple
• Complete : memory test: read and write capability generations of product development
into any DRAM on the DIMM • Best- - in- - class signal integrity: based on
• Programmable device power : supplies: completely Introspect’s award-winning ATE-on-Bench tester technology,
brings up the DIMM and the on-board PMIC the signal integrity is superior to conventional ATE
• Shmoo : and AC characterization capability: easily • Automated functional stress testing: scripting
adjust voltage and timing parameters on all input capability based on the Python language
and output pins of the tester
